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At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

As AI technology and no-code automation tools continue to evolve, manual testing seems to be losing its edge. This perception may or may not align with reality, as multiple factors are impacting ...

Semiconductor companies have come to rely on delay testing to attain high defect coverage of manufactured digital ICs. Delay testing uses TD (transition-delay) patterns that ATPG ...

The last decade has seen a massive shift toward automated testing practices, which wiped out the manual handling of a lot of rote tasks. But the pervasiveness of this change has been so quick that ...