In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

CHARLESTON, W.Va. — A test failure of the Mountain Valley Pipeline in May resulted from a manufacturer defect, not corrosion, according to an independent report commissioned by its developers. The ...

Silent data errors are raising concerns in large data centers, where they can propagate through systems and wreak havoc on long-duration programs like AI training runs. SDEs, also called silent data ...

Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for ...

Charlotte, N.C. — The IC design community has begun to question its goal of achieving fewer than 100 defective parts per million. Citing the difficulty and costs associated with the stringent ...

The reference or demodulated signal can be predetermined and stored as part of the test program. One method using EVM not only makes it possible to increase test coverage via system-level testing, but ...

CHARLESTON, W.Va. (AP) — An independent report says the test failure of the Mountain Valley Pipeline in May resulted from a manufacturer defect and not corrosion. It says the May 1 rupture was caused ...