Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...

Mutation testing is a fault-based software validation technique that involves introducing small, systematic changes (or “mutants”) into programme code to assess the capability of test suites in ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

A graph-based computational tool for detecting previously invisible genetic mutations has been developed. Researchers at the University of California, Los Angeles (UCLA; USA) and the University of ...