Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...
What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...
A new technical paper titled “Towards efficient wafer visual inspection: Exploring novel lightweight approaches for anomaly detection and defect segmentation” was published by researchers at ...
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