Microchip Technology Inc. announced an expansion of its SPI Flash memory portfolio, with the introduction of the SST25PF020B, SST25PF040B and SST25PF080B devices. The SST25PF020B, SST25PF040B and ...

SAN JOSE, Calif.--(BUSINESS WIRE)--KIOXIA America, Inc. today announced that its Universal Flash Storage 1 (UFS) Ver. 4.0 embedded flash memory devices designed for automotive applications have ...

Inventors of Flash Memory Drive Next-Gen Automotive Innovation with Higher Performance, More Efficient Data Handling, and Automotive-Grade Reliability Available in capacities of 128 GB, 256 GB, 512 GB ...

SAN JOSE, Calif.--(BUSINESS WIRE)--KIOXIA America, Inc. today announced that it has begun sampling new Universal Flash Storage (UFS) Ver. 4.1 embedded memory devices, reinforcing its leadership in ...

Automotive infotainment and telematics electronics can write and read massive amounts of data from flash memory devices, and those devices must remain reliable and error-free for extended periods of ...

Flash memory storage devices and media cards could be a serious security risk, experts said this week. Administrators have no control over the information that is transferred between one of these high ...

The European Commission has reported on the NEON project which is developing nanocrystal technology to meet the need for more powerful flash memory. Memory devices are coming under increasing pressure ...

USB storage devices and products like Sony's Memory Stick could be a serious security risk, experts said this week. Administrators have no control over the information that is transferred between one ...

Researchers are investigating how to make electronic components from eco-friendly, biodegradable materials to help address a growing public health and environmental problem: around 50 million tonnes ...

Texas Instruments (TI) has unveiled what it claims to be the “industry's first high-temperature, nonvolatile Flash memory device for harsh environments”. The SM28VLT32-HT is a 4MB non volatile flash ...

Experts in applied mathematics at RUDN University have experimentally proved that it is possible to accurately identify electronic devices by defects in flash memory cells. It turned out that the ...