Here is a probable scene and a not-so-simple question about our future with autonomous vehicles: An automated delivery truck driving its route makes a turn where it ...

The multilayer system used in lithography consists of a planarizing carbon layer beneath a hardmask etch-transferring layer and capped with a standard photoresist coating. In the past, Brewer Science ...

Production delays and quality errors are a universal challenge in manufacturing. In Aerospace and defense (A&D), however, the stakes are especially high. An equipment failure or out-of-tolerance ...

Metrology is the science of measuring, characterizing, and analyzing materials. Within metrology, there are several technologies used to detect material defects on a very small scale – precision on ...

(Nanowerk News) Computers were integrated into Industry 3.0 to reduce the use of manual labour. Industry 4.0 represents the next stage in this process. The focus is now on boosting the levels of ...

Read more about meeting the individual challenges of digital zero-defect testing and details of approaches to dealing with these challenges. The effectiveness of semiconductor manufacturing test has a ...