Abstract: Wafer maps of large-scale integration chips are matrices showing the defective chip position on a wafer. Determining defect patterns on wafer maps is crucial because these patterns indicate ...
Abstract: As wafer maps become increasingly complex and high-dimensional, conventional clustering methods often fail to uncover subtle but meaningful defect patterns critical for yield enhancement and ...
As avid puzzlers know full well, the humble jigsaw puzzle is a thing of beauty in multiple ways. Not only are jigsaws an absorbing time sink, but multiple studies have demonstrated they are good for ...
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